Kim Do | Department of Physics, Dongguk University, Seoul 100-715, Korea
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概要
Department of Physics, Dongguk University, Seoul 100-715, Korea | 論文
- Analysis of Deep-Level Defects on Proton Implanted Polycrystalline Silicon Thin Films Using Photoinduced Current Transient Spectroscopy
- Post-Annealing Effects on Fixed Charge and Slow/Fast Interface States of TiN/Al2O3/p-Si Metal–Oxide–Semiconductor Capacitor