Inagaki Kouji | Department of Precision Science and Technology, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
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- Department of Precision Science and Technology, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japanの論文著者
Department of Precision Science and Technology, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan | 論文
- Structural Analysis of Bismuth Nanowire by X-Ray Standing Wave Method
- Theoretical Study on the Scanning Tunneling Microscopy Image of Cl-Adsorbed Si(001)
- Visible Light Irradiation Effects on STM Observations of Hydrogenated Amorphous Silicon Surfaces
- Images of Scanning Tunneling Microscopy on the Si(001)-p(2 × 2) Reconstructed Surface
- Growth of Crystalline Silicon on a Cryogenic Substrate by Photochemical Reaction in a Condensed Phase