OHKUBO Hiroshi | Department of Electrical Engineering, The National Defense Academy
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- 同名の論文著者
- Department of Electrical Engineering, The National Defense Academyの論文著者
Department of Electrical Engineering, The National Defense Academy | 論文
- MTBF for Consecutive-k-out-of-n: F Systems with Nonidentical Component Availabilities (Special Section on Reliability)
- Reliability of a 2-Dimensional Consecutive k-out-of-n:F System with a Restriction in the Number of Failed Components(Special Section on Papers Selected from ITC-CSCC 2002)
- Reliability and Availability of a Repairable Lattice System(Special Section on Reliability Theory and Its Applications)
- Syk and Lyn Are Involved in Radiation-Induced Signaling, but Inactivation of Syk or Lyn alone Is Not Sufficient to Prevent Radination-Induced Apoptosis
- Distinctive Functions of Syk N-Terminal and C-Terminal SH2 Domains in the Signaling Cascade Elicited by Oxidative Stress in B Cells