Lee June | Microelectronics Laboratory, Samsung Advanced Institute of Technology
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- Lee June Keyの詳細を見る
- 同名の論文著者
- Microelectronics Laboratory, Samsung Advanced Institute of Technologyの論文著者
Microelectronics Laboratory, Samsung Advanced Institute of Technology | 論文
- Hydrogen-Induced Degradation of Oxygen Plasma Treated Ferroelectric Pb (Zr,Ti)O_3 Capacitor
- Hydrogen-Induced Degradation of Oxygen Plasma Treated Ferroelectric Pb (Zr,Ti) O_3 Capacitor
- Hydrogen-Induced Degradation of Oxygen Plasma Treated Ferroelectric Pb (Zr,Ti) O_3 Capacitor