Sumida Hitoshi | the Advanced Device Technology Laboratory, Fuji Electric Corporate Research and Development, Ltd.

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• the Advanced Device Technology Laboratory, Fuji Electric Corporate Research and Development, Ltd.の論文著者

the Advanced Device Technology Laboratory, Fuji Electric Corporate Research and Development, Ltd. | 論文

• The Substrate Bias Effect on the Static and Dynamic Characteristics of the Lateral IGBT on the Thin SOI Film

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