Satoh Akashi | Research Center For Information Security National Institute Of Advanced Industrial Science And Techn
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Research Center For Information Security National Institute Of Advanced Industrial Science And Techn | 論文
- Key-Dependent Weak IVs and Weak Keys in WEP : How to Trace Conditions Back to Their Patterns(Information Security)
- Invisibly Sanitizable Digital Signature Scheme
- Sequential Bitwise Sanitizable Signature Schemes
- An Efficient Authentication for Lightweight Devices by Perfecting Zero-Knowledgeness
- Power Analysis against a DPA-Resistant S-Box Implementation Based on the Fourier Transform