Kundu T. | Department Of Electrical Engineering Tsing-hua University:(present Address)research Center For Nanod

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Department Of Electrical Engineering Tsing-hua University:(present Address)research Center For Nanod | 論文

• Thickness Dependence of the Time Dependent Dielectric Breakdown Characteristics of Pb(Zr, Ti)O_3 Thin Film Capacitors for Memory Device Applications

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