Yoon Seok-won | It Components & Materials Technology Research Division It Convergence & Components Laborator

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It Components & Materials Technology Research Division It Convergence & Components Laborator | 論文

• Comparative Study of DC and Microwave Characteristics of 0.12μm T-Shaped Gate AlGaAs/InGaAs/GaAs PHEMTs Using a Hybrid and Conventional E-beam Lithography Process

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