Yarita Takashi | National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
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National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo | 論文
- Proton Transfer Reaction Time-of-Flight Mass Spectrometry at Low Drift-Tube Field-Strengths Using an H_2O-Rare Gas Discharge-Based Ion Source
- Organic Contaminant Detection of Silicon Wafers Using Negative Secondary Ions Induced by Cluster Ion Impacts
- Continuously cast 0.1wt% C steels with high phosphorus : microstructural design and control
- Positronium Annihilation in Fluorinated Benzene Derivatives
- Surface-sensitive Chemical Analysis of Organic Insulating Thin Films Using Negative Secondary Ions Induced by Medium Energy C60 Impacts