三田村 啓理 | 京都大学大学院情報学研究科|CREST, JST
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概要
論文 | ランダム
- Evidence of strong electron correlations in γ-iron
- 帯電液滴エッチング法によるPETフィルムのXPS深さ方向分析
- Depth profiling of perhydoropolysilazane thin film using multi anode XPS technique (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- Test of the consistency of angle resolved XPS data for depth profile reconstruction using the maximum entropy method (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- Applications of XPS on nanoscale material research (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))