今井 良伊 | （株）三菱化学安全科学研究所 鹿島研究所
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概要
論文 | ランダム
- Observation on Backscattered Electron Image (BEI) of a Scanning Electron Microscope (SEM) in Semi-thin Sections Prepared for Light Microscopy
- Preparation of 1- to 2-Micron Sections of Plastic Embedded Tissue for Enzyme Histochemistry
- New Embedding Method Employing GMA and Quetol 523 for Light and Electron Microscopic Observations of Semi-thin Sections
- Observation on the Same Place in Semi-thin Section with Both Light and Electron Microscopy
- 短期利率と長期利率の決定 (目崎憲司博士還暦記念論文集)