陳 中華 | 台湾・中央研究院
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概要
論文 | ランダム
- Reliability Analysis of Ultra Low-Temperature Polycrystalline Silicon Thin-Film Transistors
- 仮面デプレッション(masked depression)の診断
- Crystallization of Double-Layered Silicon Thin Films by Solid Green Laser Annealing
- Crystallinity evaluation by microwave photoconductivity decay in double-layered polycrystalline silicon thin films crystallized by solid green laser annealing
- Low temperature polycrystalline silicon thin film transistors flash memory with silicon nanocrystal dot