WU X. | Department of Electronic Engineering, The Chinese University of Hong Kong
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- 同名の論文著者
- Department of Electronic Engineering, The Chinese University of Hong Kongの論文著者
Department of Electronic Engineering, The Chinese University of Hong Kong | 論文
- Atomic Force Microscope Studies on Domain Dynamics in Phosphate Substituted Triglycine Sulfate Single Crystals: Evidence for the Domain Boundary Motion towards Negative Region and Holes Formation at the Domain Boundary
- Surface Morphology of Ferroelectric Domains in BaTiO_3 Single Crystals : An Atomic Force Microscope Study
- Domain Structure Investigations of Triglycine Sulfo-Phosphate Single Crystal:Evidence of Domain Motion with Time at Room Temperature
- Silicon Photonics Research in Hong Kong : Microresonator Devices and Optical Nonlinearities
- Measuring the thickness and thickness uniformity of ultra-thin AlOx films in magnetic tunneling junctions by combined RBS and conducting atomic force microscopy (マルチメディアストレージ 第6回アジア情報記録技術シンポジウム〔英文〕)