Murata Takeshi | Grad. Sch., Univ. Chiba
スポンサーリンク
概要
論文 | ランダム
- Isobutyronitrileの急性毒性
- Adrenergic Isomersの毒性比較
- Analysis of Buried-Oxide Dielectric Breakdown Mechanism in Low-Dose Separation by Implanted Oxygen (SIMOX) Substrates Fabricated by Internal Thermal Oxidation (ITOX) Process
- Analysis of Buried-Oxide Dielectric Breakdown Mechanism in Low-Dose SIMOX Structures
- Evaluation of Fixed Charge and Interface Trap Densities in SIMOX Wafers and Their Effects on Device Characteristics