高見 晋 | 大阪ガス株式会社総合研究所
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概要
論文 | ランダム
- Method for Detecting Defects in Silicon-On-Insulator Using Capacitance Transient Spectroscopy
- Growth Kinetics and Electrical Properties of Ultrathin Si Oxide Film Fabricated Using Krypton-Diluted Oxygen Plasma Excited by Electron Cyclotron Resonance
- Effects of Adsorption and Thermal Desorption of Atomic Hydrogen on Electronic and Atomic Structures of Si(111)(√ x √)-Al Surface
- Si (111)(√×√)-Al Surface Studied by Angle-Resolved Electron-Energy-Loss Spectroscopy
- GaAs MESFET's with a Thermally Stable LaB_6 Self-Aligned Gate