OH Young | Metals Processing Center, Korea Institute of Science and Technology
スポンサーリンク
概要
論文 | ランダム
- The Concentration Profiles of Phosphorus, Arsenic and Recoiled Oxygen Atoms in Si by Ion Implantation into SiO_2-Si
- Asymmetrical Profiles of Ion Implanted Phosphorus in Silicon
- 小児病棟における感染対策
- 小さな『女の一生』
- A Study of Temperature Dependence of Local Structure of Erbium(III) Bromanilate Complex by EXAFS Spectroscopy