Shinoda M. | Research Center, Sony Corporation
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概要
Research Center, Sony Corporation | 論文
- Effect of sputtering conditions on the exchange-biasing of NiFe/IrMn layers prepared by UHV-ICP sputtering system
- Derivation of Analytical Solution for Confocal Push-Pull Signals and Improved Confocal Push-Pull Detection Method Using Signal Processing
- Analysis of Confocal Push-Pull Detection of Tracking-error Signalsof Optical Disk Player
- A Monolithic Confocal Laser Coupler For an Optical Pick-up
- A Pit-edge Detection Method for Tracking-error Signals Using a Monolithic Confocal Laser Coupler