Ikeda Takeshi | Graduate School of Advanced Sciences and Matter, Hiroshima University
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Graduate School of Advanced Sciences and Matter, Hiroshima University | 論文
- Evaluation of Dielectric Reliability of Ultrathin HfSiO_xN_y in Metal-Gate Capacitors(Ultra-Thin Gate Insulators,Fundamentals and Applications of Advanced Semiconductor Devices)
- Characterization of Germanium Nanocrystallites Grown on SiO_2 by a Conductive AFM Probe Technique(Nanomaterials and Quantum-Effect Devices, Fundamental and Application of Advanced Semiconductor Devices)
- Performance Evaluation of PRML System Based on Thermal Decay Model(Recent Progress of High-Density Information Storage)
- Performance Improvement of PRML System in Perpendicular Magnetic Recording Channel with Thermal Decay
- Performance Improvement of PRML System in Perpendicular Magnetic Recording Channel with Thermal Decay(Recording systems & heads (II),The 8th Asian Symposium on Information Storage Technology (ASIST-8))