Honda N. | Faculty of Engineering, Tohoku Institute of Technology
スポンサーリンク
概要
Faculty of Engineering, Tohoku Institute of Technology | 論文
- Simulation study of bit patterned media with inclined anisotropy for recording density of 5 Tbit/in[2] (特集 ナノマグネティクス技術とその応用)
- Simulation study of bit patterned media with inclined anisotropy for recording density of 5 Tbit/in[2] (特集 ナノマグネティクス技術とその応用)
- Simulation Study of Factors That Determine Write Margins in Patterned Media(Recent Progress of High-Density Information Storage)
- Simulation study of determining factors for write margins in patterned media
- Simulation study of determining factors for write margins in patterned media(Patterned media & MRAM,The 8th Asian Symposium on Information Storage Technology (ASIST-8))