Oikawa Tetsuo | Electron Optics Division, JEOL Co., Ltd.
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概要
Electron Optics Division, JEOL Co., Ltd. | 論文
- Structure and chemistry of planar defects in bulk and thin film MoSi_2
- Simulation of atomic-scale high-angle annular dark field scanning transmission electron microscopy images
- The structure of an Al_3Pd-based modulated structure studied by atomic-scale electron microscopy observations