蔵本 淳 | 同 内科（臨床第一）部門
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概要
論文 | ランダム
- Charge Injection Characteristics of a Si Quantum Dot Floationg Gate in MOS Structures
- Memory Operation and Electron Charging Characteristics of Silicon Quantum-Dot Floating-Gate MOSFETs
- Memory Operation and Electron Charging Characteristics of Silicon Quantum-Dot Floating-Gate MOSFETs
- Etch Damage of n^+ Poly-Si Gate Side Wall as Evaluated by Gate Tunnel Leakage Current
- Transient Characteristics of Electron Charging in Si-Quantum-Dot Floating Gate MOS Memories