Jung Chul | Semiconductor R&D Samsung Electronics Co., Ltd., San #24, Nongseo–Ri, Kiheung–Eup, Yongin–Si, Kyungki–Do, 449–900, Korea
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- Semiconductor R&D Samsung Electronics Co., Ltd., San #24, Nongseo–Ri, Kiheung–Eup, Yongin–Si, Kyungki–Do, 449–900, Koreaの論文著者
論文 | ランダム
- 9-17 Differential Al tolerance in barley and citrate secretion
- RBE and Dose Distribution of Heavy Ion Beams.
- Cytosol extracted from irradiated cells induced DNA fragmentation
- Time Dependent Reduction of Skin Shrinkage in Mouse after Irradiation with the Falloff of Carbon Bragg Peak
- Dose response relations in acute cell death of pancreatic islets after irradiation of golden hamster with X-ray ,7OMeV proton and 290MeV carbon beams.