堀地 紀行 | 国士館大学 理工学部基礎理学系

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• OE-269 Septal, Anterior, and Posterior Left Atrium might be Vulnerable Sites for Electrical Impairment in Patients with Atrial Fibrillation(OE46,Atrial Fibrillation/Supraventricular Arrhythmia: Diagnosis 3 (A),Oral Presentation (English),The 73rd Annual S
• OE-268 The Significance of Complex Fractionated Atrial Electrogram for Paroxysmal Atrial Fibrillation Ablation(OE46,Atrial Fibrillation/Supraventricular Arrhythmia: Diagnosis 3 (A),Oral Presentation (English),The 73rd Annual Scientific Meeting of The Japa
• OE-040 Presence of a Low Voltage Zone (LVZ) Predicts Difficulty of Atrial Fibrillation (AF) Ablation Procedure Irrespective of the AF Type(OE07,Atrial Fibrillation/Supraventricular Arrhythmia: diagnosis 2 (A),Oral Presentation (English),The 73rd Annual Sc
• OE-039 Low Voltage Zone Represents Electrical Disorders that Precede Structural Left Atrial (LA) Change in Patients with Atrial Fibrillation (AF)(OE07,Atrial Fibrillation/Supraventricular Arrhythmia: diagnosis 2 (A),Oral Presentation (English),The 73rd An
• 133)LMTにCypher stent留置後SATを併発した1例(第127回日本循環器学会東海地方会)

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