Goto K. | Department of Metallurgy, Faculty of Engineering, Tokyo Institute of Technology
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- Department of Metallurgy, Faculty of Engineering, Tokyo Institute of Technologyの論文著者
Department of Metallurgy, Faculty of Engineering, Tokyo Institute of Technology | 論文
- Direct Determination of Stress Levels in Sputtered Films by means of X-Ray Diffraction Topographic Method
- Deformation Behaviour of TiAl Base Alloy Containing Manganese at Elevated Temperatures.