廣田 輝直 | 東京農工大学 共生科学技術研究院
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概要
論文 | ランダム
- Reduced Hot-Carrier Induced Degradation of NMOS I/O Transistors with Sub-micron Source-Drain Diffusion Length for 0.11μm Dual Gate Oxide CMOS Technology
- Improving the Accuracy of Modified Shift-and-Ratio Channel Length Extraction Method Using Scanning Capacitance Microscopy
- Effective Channel Length Shortening and Mobility Increase of p-Channel Metal Oxide Semiconductor Transistors Resulting in Higher Drive Current Using Short Source-Drain Diffusion Length
- Gas Chromatography-Optical Fiber Detector for the Speciation of Aromatic Hydrocarbons in Confined Areas
- 超音波による前方横切り移動物体の速度測定