Matsushige Kazumi | Department of Electronics Science and Engineering, Kyoto University
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概要
Department of Electronics Science and Engineering, Kyoto University | 論文
- Over-700-nm Critical Thickness of AlN Grown on 6H-SiC(0001) by Molecular Beam Epitaxy
- High-quality Epitaxial Growth of SiC and State-of-the-art Device Development